NEW PELCO® Tripod Polisher™ 590TEM, 590SEM, 590TS
三脚抛光器（Tripod Polisher又名楔入式抛光器、抛光具）由IBM公司科学家设计，是一款用于SEM和TEM电镜制样的精密仪器。它大大降低了样本对离子磨的依赖，缩短了时间，某些时候它可以省去离子磨工序。Model 590三脚抛光器（tripod polisher）即可用于平面样本的制作，也可用于截面样本。适用于多种材料，比如陶瓷、高分子、金属、地矿物质材料等。
Features & Benefits
Precise cross-sectioning at the TEM level
Repeatable and rapid production of TEM samples
Reduces ion milling time to minutes as opposed to hours
Produces large thin areas over the entire specimen
特点与优点：
* 瞬变电磁能级精确横断面测量
* 可反复且快速生产TEM标样
* 减少离子铣削时间
* 在样品中制作大且薄的区域
Operation - Standard Technique
The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis. To accomplish this, the sample is mounted on the face of a special SEM stud which is clamped into the slotted L-bracket of the PELCO® Tripod Polisher™ 590. Initial grinding is done on a 15μm metal bonded diamond disc. Further lapping and polishing continues with a succession of diamond films ranging in size from 30μm to 0.5μm. The final polish is done with a colloidal silica suspension. As lapping progresses, the two rear micrometers are used to adjust the plane of polish. With periodic examinations in an inverted microscope, the plane of polish is adjusted until it is parallel to the plane of interest. At this point the SEM stud may be moved to an ion mill for a quick milling to remove fine scratches, polishing debris and to give the surface topography prior to SEM analysis. The SEM stud can be mounted directly in the SEM for analysis. When analysis is complete, a TEM sample of the same area is made. The sample is removed from the SEM stud and attached to a single aperture TEM grid. The slotted L-bracket is removed and the TEM grid is attached to the round sample mount which is affixed to the center of the polisher. The sample is now mechanically thinned using Diamond Lapping Film. During this process the sample is periodically examined in an inverted microscope and the micrometers are adjusted to maintain the correct plane of polish. The sample is FINAL polished to 1μm or less and then ion milled for up to 15 minutes.
Operation - Wedge Technique
The preferential thinning and surface topography that occurs in briefly ion milled samples makes the study of interfaces between dissimilar materials difficult. These problems can be reduced by completely eliminating the ion milling step and mechanically polishing the sample to electron transparency by employing the wedge technique. With this technique the SEM stud is replaced, in the slotted L-bracket, with a Pyrex® insert. The sample is mounted on the face of this insert. After the plane of interest is obtained, the sample is removed and mounted on the bottom of the Pyrex® insert. The two rear micrometers are adjusted and the micrometer nearest the sample is retracted to produce a wedge shape as material is removed from the sample. The sample, with the features of interest at the apex of the wedge, is thinned from the back side until the edge of interest is ~1μm thick. The sample is then polished on a final polishing cloth such as our MultiTex Cloth (product number 816-12) with a colloidal silica suspension until thickness fringes are visible (below a few thousand angstroms). The sample is then removed from the Pyrex® insert and attached to a single aperture TEM grid for analysis.
Ted Pella三脚抛光器：
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59100 |
NEW PELCO® Tripod Polisher™ 590TEM precision sample thinning for TEM |
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59200 |
NEW PELCO® Tripod Polisher™ 590SEM precision sample preparation for SEM |
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59300 |
NEW PELCO® Tripod Polisher™ 590TS configured for SEM and TEM sample preparation |
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关于Ted Pella
Ted Pella manufacture and sell instruments and supplies to serve laboratories dedicated to a variety of types of microscopy: Transmission and Scanning Electron Microscopy, Electron Microprobe Analysis, Atomic Force Microscopy, Confocal Laser Microscopy and Light Microscopy.
We serve colleges and universities, private companies, hospitals and various branches of government, domestic and international. We serve a diverse set of fields including Aerospace, Automotive, Biology, Biotechnology, Chemistry, Chemical Engineering, Energy, Failure Analysis, Food & Beverages, Forensics, Genetics, Histology, Metals/Plastics/Rubber/Materials Science, MEMS, Metallurgy/Metallography, Microelectronics, Nanotechnology, Neurosciences, Pathology, Pharmaceuticals, Physics, Quality Assurance and Semiconductors.
Thank you, our customers, for your support of and interest in Ted Pella, Inc.
Ted Pella 公司：
Ted Pella是制造和销售仪器和用品厂商，服务于实验室，致力于各种类型的显微镜：透射和扫描电子显微镜，电子探针分析，原子力显微镜，共聚焦激光显微镜和光学显微镜。
Ted Pella为学院、大学、私人公司、医院以及政府、国内和国际的各个分支机构服务。
Ted Pella服务于一个多元化的领域，包括航空航天、汽车、生物、化学、化工、能源、故障分析、食品饮料、法医学、遗传学、组织学、金属/塑料/橡胶/材料科学、MEMS、冶金/金相、微电子、纳米技术。神经科学、病理学、药物、物理、质量保证和半导体。
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2295841067
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